At the appropriate time, the CE and WE pins are pulsed and a location in the FLASH memory is programmed. Programming with 1149.1 facilitates the use of a common tool and programming methodology for design verification and debug, manufacturing test and field changes.Ī FLASH device is programmed in-system by scanning the address and program data to the proper scan pins of an IEEE 1149.1 boundary-scan device that is connected to the FLASH memory. IEEE 1149.1/JTAG enables in-system FLASH programming without requiring expensive in-circuit test equipment (ICT) or the addition of test access points to the PCB. Determining the optimal technique is often a challenge a designer must develop a solution that balances flexibility, cost and programming time. Programming FLASH devices in or out of the system can be done using one of several techniques. FLASH memory is a flexible storage solution for CPU and micro-controller based designs.
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